PXIe, 4-channel, ± 24V, 150 mA, precision PXI source measurement unit

The PXIe-4143 is a 4-channel source measurement unit (SMU) ideal for high pin count applications. The module operates in a four-quadrant mode, with remote (4-wire) sensing capabilities integrated in each channel for accurate measurements. The high sampling rate of the PXIe-4143 helps to shorten the measurement time, capture the transient characteristics of the device, and enable rapid IV characteristic analysis of the device under test (DUT). With the high-speed sequence engine, users can synchronize these SMUs with each other or with other instruments, such as switches or high-speed digital test modules. In addition, SourceAdapt technology can adjust the PXIe-4143’s response to any load to obtain the best response, maximize stability and minimize transient characteristics.

National Instruments PXIe-4143 PXI source measurement unit

The PXIe-4143 (Part number: 782431-01) Source Measurement Unit (SMU) integrates a utility channel that can provide current or voltage with a 16-bit set point and estimated resolution. Users can utilize this output (which provides up to 6 V and 1 A) as a supplemental power source for the SMU channel. Applications such as characterization of transistors that require a stable current or voltage to simultaneously scan another current or voltage can benefit significantly by reducing the complexity, space, and cost offered by this module. For parallel test applications, users can implement 17 SMU channels and 17 programmable power channels in 19 inch and 4U space using 17 NI PXIe-4143 modules.

The PXIe 4143 SMU’s two channels can be used as a constant voltage or steady current source, with movable consistency limits for any mode. In addition, users can implement remote sensing functions on the SMU channel to enhance the output/voltage estimation accuracy of the measured gadget for high-precision applications.

The estimation strategy of the PXIe-4143 SMU is typically based on adding the current motion to the standard of the bipolar circuit and then adding it to the voltage response estimation. This policy is used if the device under test (DUT) has low resistance; In the case of high DUT internal resistance, the addition of voltage motion is performed and the current response is estimated